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  • Coverage-aware test database reduction [2016]

    Category:
    Artículos
    Authors:
    Raquel Blanco Aguirre , Pablo Javier Tuya González , Claudio A. de la Riva Álvarez , María José Suárez Cabal
    Date:
    01 of January of 2016
    It Is a Part of:
    IEEE Transactions on Software Engineering