Industrial and Intellectual Property
-
Coverage-aware test database reduction [2016]
- Category:
- Artículos
- Authors:
- Raquel Blanco Aguirre , María José Suárez Cabal , Claudio A. de la Riva Álvarez , Pablo Javier Tuya González
- Date:
- 01 of January of 2016
- It Is a Part of:
- IEEE Transactions on Software Engineering