Industrial and Intellectual Property

  • Coverage-aware test database reduction [2016]

    Category:
    Artículos
    Authors:
    Raquel Blanco Aguirre , María José Suárez Cabal , Claudio A. de la Riva Álvarez , Pablo Javier Tuya González
    Date:
    01 of January of 2016
    It Is a Part of:
    IEEE Transactions on Software Engineering