Industrial and Intellectual Property
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Automatic Testing of Design Faults in MapReduce Applications [2018]
- Category:
- Artículos
- Authors:
- Pablo Javier Tuya González , Claudio A. de la Riva Álvarez , Antonia Bertolino , Jesús Morán Barbón
- Date:
- 01 of January of 2018
- It Is a Part of:
- IEEE Transactions on Reliability, 67(3)