Industrial and Intellectual Property

  • Automatic Testing of Design Faults in MapReduce Applications [2018]

    Category:
    Artículos
    Authors:
    Pablo Javier Tuya González , Claudio A. de la Riva Álvarez , Antonia Bertolino , Jesús Morán Barbón
    Date:
    01 of January of 2018
    It Is a Part of:
    IEEE Transactions on Reliability, 67(3)